Comparison between conventional imaging using an imaging system (left) and “diffractive imaging” (right). Our EUV diffractive imaging experiment setup. A photo of the high-harmonic generation (HHG) ...

Tokyo, Japan – Scientists from Tokyo Metropolitan University have used machine learning to automate the identification of defects in sister chromatid cohesion. They trained a convolutional neural ...

Detecting macro-defects early in the wafer processing flow is vital for yield and process improvement, and it is driving innovations in both inspection techniques and wafer test map analysis. At the ...

One of the biggest challenges for non-AI experts is the terminology. Artificial intelligence (AI), machine learning (ML), and computer vision (CV) are frequently discussed, but people outside of data ...

Automated optical inspection (AOI) is a cornerstone in semiconductor manufacturing, assembly and testing facilities, and as such, it plays a crucial role in yield management and process control.

In a new proof-of-concept study researchers are pioneering the use of a unique Artificial Intelligence-based deep learning model as an assistive tool for the rapid and accurate reading of ultrasound ...